Инд. авторы:	Lavrent'ev Y.G., Usova L.V.
Заглавие:	Problem of the Account of Matrix Effect in Electron Probe Microanalysis of Rock-Forming Minerals
Библ. ссылка:	Lavrent'ev Y.G., Usova L.V. Problem of the Account of Matrix Effect in Electron Probe Microanalysis of Rock-Forming Minerals // Journal of Analytical Chemistry. - 2018. - Vol.73. - Iss. 1. - P.42-49. - ISSN 1061-9348. - EISSN 1608-3199.
Внешние системы:	DOI: 10.1134/S1061934817110077; РИНЦ: 35499688; SCOPUS: 2-s2.0-85043380400; WoS: 000427083100007;
Реферат:	eng: Four methods of correction and three methods of calculation of absorption coefficients are tested in electron probe microanalysis of rock-forming minerals. Experimental data by Pouchou and Pichoir, Sewell-Love-Scott, and Armstrong are attracted in tests. It is shown that the correction factor can be calculated with the error no more than 1 rel. % if a short-wave line (matrix effect is determined mainly by the effect of atomic number) is used as an analytical line or the analytical line belongs to the absorption K-edge of elements present in the sample. In the presence of binary matrix effect, when the analytical line absorbs in the K-L (1) region, the situation is more complex and additional studies are required.
Ключевые слова:	correction methods; matrix effect; electron probe microanalysis; rock-forming minerals; mass absorption coefficients;
Издано:	2018
Физ. характеристика:	с.42-49
Цитирование:	1. Lavrent’ev, Yu.G. and Usova, L.V., J. Anal. Chem., 1996, vol. 51, no. 3, p. 300. 2. Pouchou, J.-L. and Pichoir, F., in Electron Probe Quantitation, New York: Plenum, 1991, p. 31. 3. Merlet, C., Microbeam Anal., 1995, vol. 4, p. 239. 4. Bastin, G.F., Dijkstra, J.M., and Heijligers, H.J.M., X-Ray Spectrom., 1998, vol. 27, p. 3. 5. Lavrent’ev, Yu.G., Korolyuk, V.N., and Usova, L.V., J. Anal. Chem., 2004, vol. 59, no. 7, p. 600. 6. Marenkov, O.S., Tablitsy i formuly rentgenospektral’nogo analiza (Tables and Equations for X-Ray Spectral Analysis), Leningrad: Mashinostroenie, 1981, no. 1; 1982, no. 3. 7. Orlik, I., Loh, K.K., Sow, C.H., Tang, S.M., and Thong, P., Nucl. Instrum. Methods Phys. Res., Sect. B, 1993, vol. 74, no. 3, p. 352. 8. Finkel’shtein, A.L. and Farkov, P.M., Analitika Kontrol’, 2002, vol. 6, no. 4, p. 377. 9. Ebel, H., Svagera, R., Ebel, M.H., Shaltout, A., and Hubbel, J.H., X-Ray Spectrom., 2006, vol. 32, p. 442. 10. Lavrent’ev, Yu.G. and Usova, L.V., Analitika Kontrol’, 2016, vol. 20, no. 1, p. 15. 11. Scofield, J.H., Theoretical Photoionization Cross-Section from 1 to 1500 keV, Lawrence Livermore Labor. Rep. UCRL-51326, 1973. 12. Heinrich, K.F.J., in Proc. 11th Int. Congr. X-Ray Optics and Microanalysis, Brown, J.D. and Packwood, R.H., Eds., Ontario: Ontario Univ., 1987, p. 67. 13. Korolyuk, V.N., Lavrent’ev, Yu.G., Usova, L.V., and Nigmatulina, E.N., Russ. Geol. Geophys., 2008, vol. 49, no. 3, p. 165. 14. Lavrent’ev, Yu.G., Korolyuk, V.N., Usova, L.V., and Nigmatulina, E.N., Russ. Geol. Geophys., 2015, vol. 56, no. 10, p. 1428. 15. Sewell, D.A., Love, G., and Scott, V.D., J. Phys. D: Appl. Phys., 1985, vol. 18, p. 1245. 16. Armstrong, J.T., in Microbeam Analysis, San Francisco: San Francisco Press, 1988, p. 239.