| Инд. авторы: | Atuchin V.V., Golyashov V.A., Kokh K.A., Korolkov I.V., Kozhukhov A.S., Kruchinin V.N., Loshkarev I.D., Pokrovsky L.D., Prosvirin I.P., Romanyuk K.N., Tereshchenko O.E. |
| Заглавие: | Crystal growth of Bi2Te3 and noble cleaved (0001) surface properties |
| Библ. ссылка: | Atuchin V.V., Golyashov V.A., Kokh K.A., Korolkov I.V., Kozhukhov A.S., Kruchinin V.N., Loshkarev I.D., Pokrovsky L.D., Prosvirin I.P., Romanyuk K.N., Tereshchenko O.E. Crystal growth of Bi2Te3 and noble cleaved (0001) surface properties // Journal of Solid State Chemistry. - 2016. - Vol.236. - P.203-208. - ISSN 0022-4596. - EISSN 1095-726X. |
| Внешние системы: | DOI: 10.1016/j.jssc.2015.07.031; SCOPUS: 2-s2.0-84961192792; WoS: 000372672900026; |
| Реферат: | eng: A high quality Bi2Te3 crystal has been grown by Bridgman method with the use of rotating heat field. The phase purity and bulk structural quality of the crystal have been verified by XRD analysis and rocking curve observation. The atomically smooth Bi2Te3(0001) surface with an excellent crystallographic quality is formed by cleavage in the air. The chemical and microstructural properties of the surface have been evaluated with RHEED, AFM, STM, SE and XPS. The Bi2Te3(0001) cleaved surface is formed by atomically smooth terraces with the height of the elemental step of ∼1.04±0.1 nm, as estimated by AFM. There is no surface oxidation process detected over a month keeping in the air at normal conditions, as shown by comparative core level photoelectron spectroscopy. © 2015, Elsevier Inc. All rights reserved.
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| Ключевые слова: | STM; Cleavage; Bridgman techniques; AFM; X ray photoelectron spectroscopy; Selenium; Reflection high energy electron diffraction; Quality control; Photoelectron spectroscopy; Core levels; XRD; XPS; STM; SE; RHEED; Cleavage; Bridgman technique; Bi2Se3; AFM; Crystal growth from melt; XRD; |
| Издано: | 2016 |
| Физ. характеристика: | с.203-208 |