Инд. авторы: | Korolyuk V.N., Lavrent'ev Yu.G., Usova L.V., Nigmatulina E.N. |
Заглавие: | Some features of X-ray registration using a JXA-8100 electron-probe microanalyzer |
Библ. ссылка: | Korolyuk V.N., Lavrent'ev Yu.G., Usova L.V., Nigmatulina E.N. Some features of X-ray registration using a JXA-8100 electron-probe microanalyzer // Journal of Analytical Chemistry. - 2010. - Vol.65. - Iss. 3. - P.249-254. - ISSN 1061-9348. - EISSN 1608-3199. |
Внешние системы: | DOI: 10.1134/S106193481003007X; SCOPUS: 2-s2.0-77953345161; |
Реферат: | eng: Specific sources of measurement errors have been studied. In the presence of perturbing radiation, the automatic setting of the spectrometer discrimination mode is not reasonable. When choosing the transmittance window, the dependence of the shift of the amplitude distribution on the counting rate should be taken into account. Losses of intensity can be significant. The value of effective dead time is 1.3 μs for spectrometers with flow methane-argon counters and 1.2-1.5 μs for spectrometric channels with sealed xenon counters. The mode of constant dead time is retained till the intensities of 100-150 kcps. The instrumental error of routine analysis is insignificant as compared with the statistical error of count collection. In the spectra from LiF crystals, a dip in intensities is adjacent to the shortwave wing of the AuLα radiation line. Measuring intensities on it results in overestimates of the analyte concentration, and line weakening, which occurs because of the spectral hole, in contrast, leads to its underestimation. For this reason, in determining small concentrations of gold, using the L α line as an analytical one seems unreasonable. © Pleiades Publishing, Ltd., 2010.
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Ключевые слова: | Xenon; Three term control systems; Spectrometry; Spectrometers; Methane; Hole concentration; Argon; Statistical errors; Spectrometric channels; Spectral hole; Measurement errors; Routine analysis; LiF crystal; Instrumental error; Electron-probe microanalyzer; Dead time; Counting rates; Automatic settings; Analyte concentration; Amplitude distributions; Small concentration; |
Издано: | 2010 |
Физ. характеристика: | с.249-254 |