Инд. авторы: | Shiryaev A.A., Masiello F., Hartwig J., Kupriyanov I.N., Lafford T.A., Titkov S.V., Palyanov Y.N. |
Заглавие: | X-ray topography of diamond using forbidden reflections: Which defects do we really see? |
Библ. ссылка: | Shiryaev A.A., Masiello F., Hartwig J., Kupriyanov I.N., Lafford T.A., Titkov S.V., Palyanov Y.N. X-ray topography of diamond using forbidden reflections: Which defects do we really see? // Journal of Applied Crystallography. - 2011. - Vol.44. - Iss. 1. - P.65-72. - ISSN 0021-8898. - EISSN 1600-5767. |
Внешние системы: | DOI: 10.1107/S0021889810049599; SCOPUS: 2-s2.0-79251522483; |
Реферат: | eng: Natural and synthetic diamonds with various concentrations and types of point and extended defect were investigated using X-ray topography employing allowed (111, 004) and forbidden (222) reflections. On the topographs of the forbidden reflections, weak stress fields from lattice imperfections and extended defects are readily observed. Comparison of the topographs with IR maps of the distribution of point defects suggests that certain types of point defect may increase the structure factors of the forbidden reflections. © 2011 International Union of Crystallography Printed in Singapore-all rights reserved.
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Ключевые слова: | X rays; Topography; Synthetic diamonds; Point defects; Diamonds; X-ray topography; Structure factors; Stress field; Defects; forbidden reflections; Extended defect; X-ray topography; point and extended defects; nitrogen; forbidden reflections; diamond; Lattice imperfection; |
Издано: | 2011 |
Физ. характеристика: | с.65-72 |