Инд. авторы:	Jochum K.P., Weis U., Stoll B., Kuzmin D.V., Yang Q., Raczek I., Jacob D.E., Stracke A., Birbaum K., Frick D.A., Günther D., Enzweiler J.
Заглавие:	Determination of reference values for NIST SRM 610-617 glasses following ISO guidelines
Библ. ссылка:	Jochum K.P., Weis U., Stoll B., Kuzmin D.V., Yang Q., Raczek I., Jacob D.E., Stracke A., Birbaum K., Frick D.A., Günther D., Enzweiler J. Determination of reference values for NIST SRM 610-617 glasses following ISO guidelines // Geostandards and Geoanalytical Research. - 2011. - Vol.35. - Iss. 4. - P.397-429. - ISSN 1639-4488. - EISSN 1751-908X.
Внешние системы:	DOI: 10.1111/j.1751-908X.2011.00120.x; SCOPUS: 2-s2.0-81255148644;
Реферат:	eng: We present new reference values for the NIST SRM 610-617 glasses following ISO guidelines and the International Association of Geoanalysts' protocol. Uncertainties at the 95% confidence level (CL) have been determined for bulk- and micro-analytical purposes. In contrast to former compilation procedures, this approach delivers data that consider present-day requirements of data quality. New analytical data and the nearly complete data set of the GeoReM database were used for this study. Data quality was checked by the application of the Horwitz function and by a careful investigation of analytical procedures. We have determined quantitatively possible element inhomogeneities using different test portion masses of 1, 0.1 and 0.02μg. Although avoiding the rim region of the glass wafers, we found moderate inhomogeneities of several chalcophile/siderophile elements and gross inhomogeneities of Ni, Se, Pd and Pt at small test portion masses. The extent of inhomogeneity was included in the determination of uncertainties. While the new reference values agree with the NIST certified values with the one exception of Mn in SRM 610, they typically differ by as much as 10% from the Pearce (1997) values in current use. In a few cases (P, S, Cl, Ta, Re) the discrepancies are even higher. © 2011 The Authors. Geostandards and Geoanalytical Research © 2011 International Association of Geoanalysts.
Ключевые слова:	Analytical data; Analytical procedure; Certified values; Characterisation; Confidence levels; Data quality; Data sets; Glass wafer; Inhomogeneities; International Association; NIST; Reference values; Rim region; Chlorine; Manganese; Microanalysis; Palladium; Glass; Semiconducting selenium compounds; Selenium compounds; Platinum; NIST; Microanalysis; Glass reference materials; Sample inhomogeneity; Characterisation;
Издано:	2011
Физ. характеристика:	с.397-429