Инд. авторы:	Atuchin V.V., Isaenko L.I., Kesler V.G., Pokrovsky L.D., Tarasova A.Y.
Заглавие:	Electronic parameters and top surface chemical stability of RbPb 2Br 5
Библ. ссылка:	Atuchin V.V., Isaenko L.I., Kesler V.G., Pokrovsky L.D., Tarasova A.Y. Electronic parameters and top surface chemical stability of RbPb 2Br 5 // Materials Chemistry and Physics. - 2012. - Vol.132. - Iss. 1. - P.82-86. - ISSN 0254-0584.
Внешние системы:	DOI: 10.1016/j.matchemphys.2011.10.054; SCOPUS: 2-s2.0-84355166481;
Реферат:	eng: The RbPb 2Br 5 crystal has been grown by Bridgman method. The electronic structure of RbPb 2Br 5 has been measured with XPS for a powder sample. High chemical stability of RbPb 2Br 5 surface is verified by weak intensity of O 1s core level recorded by XPS and structural RHEED measurements. Chemical bonding effects have been observed by the comparative analysis of element core levels and crystal structure of RbPb 2Br 5 and several rubidium- and lead-containing bromides using binding energy difference parameters Δ Rb = (BE Rb 3d - BE Br 3d) and Δ Pb = (BE Pb 4f 7/2 - BE Br 3d). © 2011 Elsevier B.V.
Ключевые слова:	A. Surfaces; Core levels; Electronic parameters; Energy differences; Powder samples; Top surface; Weak intensity; X ray photoemission spectroscopy; Binding energy; Bromine compounds; Chemical analysis; Bromine; X ray photoelectron spectroscopy; X ray crystallography; Surfaces; Surface properties; Rubidium; Reflection high energy electron diffraction; Photoelectron spectroscopy; Lead; Emission spectroscopy; Electronic structure; Crystal structure; Crystal growth from melt; Chemical stability; Chemical bonds; Comparative analysis; Chemical bondings; C. Reflection high energy electron diffraction (RHEED); D. Surface properties; D. Crystallography; C. X-ray photo-emission spectroscopy (XPS); C. Reflection high energy electron diffraction (RHEED); A. Optical materials; B. Crystal growth;
Издано:	2012
Физ. характеристика:	с.82-86