Инд. авторы:	Dar'in A.V., Kalugin I.A., Rakshun Y.V.
Заглавие:	Studying variations in the elemental composition of annual layers in microsections of lake teletskoye sediments by means of scanning X-ray fluorescent microanalysis using synchrotron radiation
Библ. ссылка:	Dar'in A.V., Kalugin I.A., Rakshun Y.V. Studying variations in the elemental composition of annual layers in microsections of lake teletskoye sediments by means of scanning X-ray fluorescent microanalysis using synchrotron radiation // Bulletin of the Russian Academy of Sciences: Physics. - 2013. - Vol.77. - Iss. 2. - P.188-190. - ISSN 1062-8738. - EISSN 1934-9432.
Внешние системы:	DOI: 10.3103/S1062873813020123; SCOPUS: 2-s2.0-84876476188;
Реферат:	eng: SR scanning XRF is used to analyze the annual elemental layers of bottom sediments from Lake Teletskoye. Scanning is conducted with a pitch of 0.1 mm at energies of 16, 24, and 38 keV. The content of more than 15 elements are determined: K, Ca, Ti, Mn, Fe, V, Cr, Ni, Cu, Zn, As, Rb, Sr, Y, Zr, Cd, Sn, I, and Ba (range of concentrations, 0.005-10%). A cross section containing (1) the upper part of an underlying layer, (2) the total annual layer, (3) one more complete layer, and (4) the lower part of an overlapping layer is measured. Geochemical indicators reflecting the rhythm of annual precipitation are found. © 2013 Allerton Press, Inc.
Ключевые слова:	Lakes; Scanning; Sedimentology; Strontium; Zirconium; Titanium; Annual precipitation; Bottom sediments; Elemental compositions; Underlying layers; Geochemical indicators;
Издано:	2013
Физ. характеристика:	с.188-190