Инд. авторы: | Gadiyak G.V. |
Заглавие: | Physical Model and Numerical Results of Dissociation Kinetics of Hydrogen-Passivated Si/SiO3 Interface Defects |
Библ. ссылка: | Gadiyak G.V. Physical Model and Numerical Results of Dissociation Kinetics of Hydrogen-Passivated Si/SiO3 Interface Defects // International Conference on Advanced Materials, 16-20 June, 1997, Strasbourg, France, 1997. |
Издано: | 1997 |