Инд. авторы: Gadiyak G.V.
Заглавие: Physical Model and Numerical Results of Dissociation Kinetics of Hydrogen-Passivated Si/SiO3 Interface Defects
Библ. ссылка: Gadiyak G.V. Physical Model and Numerical Results of Dissociation Kinetics of Hydrogen-Passivated Si/SiO3 Interface Defects // International Conference on Advanced Materials, 16-20 June, 1997, Strasbourg, France, 1997.
Издано: 1997