| Инд. авторы: | Gadiyak G.V., Lim K., Hong S., Lee Q. |
| Заглавие: | A Simple Model and Computer Simulation Results of Accumulation of Charge in Thin $SiO_2$ Films Under Fowler-Nordheim Injection and Time to Breakdown in High Fields |
| Библ. ссылка: | Gadiyak G.V., Lim K., Hong S., Lee Q. A Simple Model and Computer Simulation Results of Accumulation of Charge in Thin $SiO_2$ Films Under Fowler-Nordheim Injection and Time to Breakdown in High Fields // The Proceedings of the 5 International Conference on Simulation of Devices and Technologies. ICSDT'96. Obninsk, 1996. - С.57-63. |
| Издано: | Obninsk: , 1996 |
| Физ. характеристика: | с.57-63 |